Best Papers
 Blade Pin Optimal Design on Semiconductor Measurements for High-Speed Data Transmission Applications 


Vol. 50,  No. 6, pp. 896-905, Jun.  2025
10.7840/kics.2025.50.6.896


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  Abstract

This paper presents an optimal design of the blade pin shape for high-speed semiconductor measurements. Because the signal integrity and less tx. loss can be achieved by microwave frequency responses for high-speed data measurements of semiconductor ICs, the probing blade pin requires electrical tx. performances and the durablility and performance stability under physical pressure physical pressure. This researh has conducted analog permance analysis in terms of the no. of curve, EFC fabrication, and tip shapes, as well as eye-pattern simulations for digital tx. performance verifications. From experimental and analytical results, the blade pin presents relatively superior performances under less no. of curve, no EFC process, and a wide tip area, thus providing an optimized design method for blade pins for high-speed data transmission applications.

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  Cite this article

[IEEE Style]

M. Bae, H. Lee, J. H. Jeong, S. Son, J. Lim, S. Han, "Blade Pin Optimal Design on Semiconductor Measurements for High-Speed Data Transmission Applications," The Journal of Korean Institute of Communications and Information Sciences, vol. 50, no. 6, pp. 896-905, 2025. DOI: 10.7840/kics.2025.50.6.896.

[ACM Style]

Minji Bae, Hee-Joon Lee, Jang Hoon Jeong, Seong-Ho Son, Jongsik Lim, and Sang-Min Han. 2025. Blade Pin Optimal Design on Semiconductor Measurements for High-Speed Data Transmission Applications. The Journal of Korean Institute of Communications and Information Sciences, 50, 6, (2025), 896-905. DOI: 10.7840/kics.2025.50.6.896.

[KICS Style]

Minji Bae, Hee-Joon Lee, Jang Hoon Jeong, Seong-Ho Son, Jongsik Lim, Sang-Min Han, "Blade Pin Optimal Design on Semiconductor Measurements for High-Speed Data Transmission Applications," The Journal of Korean Institute of Communications and Information Sciences, vol. 50, no. 6, pp. 896-905, 6. 2025. (https://doi.org/10.7840/kics.2025.50.6.896)
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pISSN : 1226 - 4717
eISSN : 2287 - 3880