Design and Implementation of Improved March Test Algorithm for Embedded Memories
Vol. 22, No. 7, pp. 1394-1402, Jul. 1997
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Cite this article
[IEEE Style]
박강민, 장훈, 양승민, "Design and Implementation of Improved March Test Algorithm for Embedded Memories," The Journal of Korean Institute of Communications and Information Sciences, vol. 22, no. 7, pp. 1394-1402, 1997. DOI: .
[ACM Style]
박강민, 장훈, and 양승민. 1997. Design and Implementation of Improved March Test Algorithm for Embedded Memories. The Journal of Korean Institute of Communications and Information Sciences, 22, 7, (1997), 1394-1402. DOI: .
[KICS Style]
박강민, 장훈, 양승민, "Design and Implementation of Improved March Test Algorithm for Embedded Memories," The Journal of Korean Institute of Communications and Information Sciences, vol. 22, no. 7, pp. 1394-1402, 7. 1997.
pISSN : 1226 - 4717
eISSN : 2287 - 3880