Normalized Region Extraction of Facial Features by Using 


Vol. 29,  No. 6, pp. 815-823, Jun.  2004


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  Abstract

A hue-based attention operator and a combinational integral projection function(CIPF) are proposed to extract the normalized regions of face and facial features robustly against illumination variation. The face candidate regions are efficiently detected by using skin color filter, and the eyes are located accurately and robustly against illumination variation by applying the proposed hue-and symmetry-based attention operator to the face candidate regions. And the faces are confirmed by verifying the eyes with the color-based eye variance filter. The proposed CIPF, which combines the weighted hue and intensity, is applied to detect the accurate vertical locations of the eyebrows and the mouth under illumination variations and the existence of mustache. The global face and its local feature regions are exactly located and normalized based on these accurate geometrical information. Experimental results on the AR face database[8] show that the proposed eye detection method yields better detection rate by about 39.3% than the conventional gray GST-based method. As a result, the normalized facial features can be extracted robustly and consistently based on the exact eye location under illumination variations.

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  Cite this article

[IEEE Style]

E. Jung, J. Kim, J. Jeon, H. Choi, "Normalized Region Extraction of Facial Features by Using," The Journal of Korean Institute of Communications and Information Sciences, vol. 29, no. 6, pp. 815-823, 2004. DOI: .

[ACM Style]

Eui-Jung Jung, Jong-Hwa Kim, Joon-Hyung Jeon, and Heung-Moon Choi. 2004. Normalized Region Extraction of Facial Features by Using. The Journal of Korean Institute of Communications and Information Sciences, 29, 6, (2004), 815-823. DOI: .

[KICS Style]

Eui-Jung Jung, Jong-Hwa Kim, Joon-Hyung Jeon, Heung-Moon Choi, "Normalized Region Extraction of Facial Features by Using," The Journal of Korean Institute of Communications and Information Sciences, vol. 29, no. 6, pp. 815-823, 6. 2004.

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pISSN : 1226 - 4717
eISSN : 2287 - 3880