An Object-Oriented Redundant Fault Detection Scheme for Efficient Current Testing
Vol. 27, No. 1, pp. 96-102, Jan. 2002
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Cite this article
[IEEE Style]
S. Bae, K. Kim, B. Chon, "An Object-Oriented Redundant Fault Detection Scheme for Efficient Current Testing," The Journal of Korean Institute of Communications and Information Sciences, vol. 27, no. 1, pp. 96-102, 2002. DOI: .
[ACM Style]
Sung-Hwan Bae, Kwan-Woong Kim, and Byoung-sil Chon. 2002. An Object-Oriented Redundant Fault Detection Scheme for Efficient Current Testing. The Journal of Korean Institute of Communications and Information Sciences, 27, 1, (2002), 96-102. DOI: .
[KICS Style]
Sung-Hwan Bae, Kwan-Woong Kim, Byoung-sil Chon, "An Object-Oriented Redundant Fault Detection Scheme for Efficient Current Testing," The Journal of Korean Institute of Communications and Information Sciences, vol. 27, no. 1, pp. 96-102, 1. 2002.