Complex Dielectric Constant Measurements for Conductor-Loaded Composite Materials Using Genetic Algorithms
Vol. 30, No. 2, pp. 10-15, Feb. 2005
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Cite this article
[IEEE Style]
S. Lee, "Complex Dielectric Constant Measurements for Conductor-Loaded Composite Materials Using Genetic Algorithms," The Journal of Korean Institute of Communications and Information Sciences, vol. 30, no. 2, pp. 10-15, 2005. DOI: .
[ACM Style]
Sang-il Lee. 2005. Complex Dielectric Constant Measurements for Conductor-Loaded Composite Materials Using Genetic Algorithms. The Journal of Korean Institute of Communications and Information Sciences, 30, 2, (2005), 10-15. DOI: .
[KICS Style]
Sang-il Lee, "Complex Dielectric Constant Measurements for Conductor-Loaded Composite Materials Using Genetic Algorithms," The Journal of Korean Institute of Communications and Information Sciences, vol. 30, no. 2, pp. 10-15, 2. 2005.