Matching-based Advanced Integrated Diagnosis Method 


Vol. 32,  No. 4, pp. 379-386, Apr.  2007


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  Abstract

In this paper, we propose an efficient diagnosis algorithm for multiple stuck-at faults. Because of using vectorwise intersections as an important metric of diagnosis, the proposed diagnosis algorithm can diagnose multiple defects in single stuck-at fault simulator. In spite of multiple fault diagnosis, the number of candidate faults is drastically reduced. For identifying faults, the variable weight, positive calculations and negative calculations are used for the matching algorithm. To verify our algorithm, experiments were performed for ISCAS85 and full-scan version of ISCAS89 benchmark circuits.

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  Cite this article

[IEEE Style]

Y. Lim and S. Kang, "Matching-based Advanced Integrated Diagnosis Method," The Journal of Korean Institute of Communications and Information Sciences, vol. 32, no. 4, pp. 379-386, 2007. DOI: .

[ACM Style]

Yoseop Lim and Sungho Kang. 2007. Matching-based Advanced Integrated Diagnosis Method. The Journal of Korean Institute of Communications and Information Sciences, 32, 4, (2007), 379-386. DOI: .

[KICS Style]

Yoseop Lim and Sungho Kang, "Matching-based Advanced Integrated Diagnosis Method," The Journal of Korean Institute of Communications and Information Sciences, vol. 32, no. 4, pp. 379-386, 4. 2007.

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pISSN : 1226 - 4717
eISSN : 2287 - 3880