Embodiment of High Impedance Surface of Meta-Material Characteristic Using Symmetrical AMC Structure and Its SAR Analysis
Vol. 38, No. 9, pp. 744-750, Sep. 2013
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Cite this article
[IEEE Style]
S. Lee, M. Lee, S. Rhee, N. Kim, "Embodiment of High Impedance Surface of Meta-Material Characteristic Using Symmetrical AMC Structure and Its SAR Analysis," The Journal of Korean Institute of Communications and Information Sciences, vol. 38, no. 9, pp. 744-750, 2013. DOI: .
[ACM Style]
Seungwoo Lee, Moung-Hee Lee, Seung-Yeop Rhee, and Nam Kim. 2013. Embodiment of High Impedance Surface of Meta-Material Characteristic Using Symmetrical AMC Structure and Its SAR Analysis. The Journal of Korean Institute of Communications and Information Sciences, 38, 9, (2013), 744-750. DOI: .
[KICS Style]
Seungwoo Lee, Moung-Hee Lee, Seung-Yeop Rhee, Nam Kim, "Embodiment of High Impedance Surface of Meta-Material Characteristic Using Symmetrical AMC Structure and Its SAR Analysis," The Journal of Korean Institute of Communications and Information Sciences, vol. 38, no. 9, pp. 744-750, 9. 2013.