Lifetime Prediction of RF SAW Duplexer Using Accelerated Life Testing
Vol. 39, No. 10, pp. 616-618, Oct. 2014
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Cite this article
[IEEE Style]
Y. Kim, T. Kim, S. Kang, "Lifetime Prediction of RF SAW Duplexer Using Accelerated Life Testing," The Journal of Korean Institute of Communications and Information Sciences, vol. 39, no. 10, pp. 616-618, 2014. DOI: .
[ACM Style]
Young-Goo Kim, Tae-Hong Kim, and Sang-gee Kang. 2014. Lifetime Prediction of RF SAW Duplexer Using Accelerated Life Testing. The Journal of Korean Institute of Communications and Information Sciences, 39, 10, (2014), 616-618. DOI: .
[KICS Style]
Young-Goo Kim, Tae-Hong Kim, Sang-gee Kang, "Lifetime Prediction of RF SAW Duplexer Using Accelerated Life Testing," The Journal of Korean Institute of Communications and Information Sciences, vol. 39, no. 10, pp. 616-618, 10. 2014.
pISSN : 1226 - 4717
eISSN : 2287 - 3880