Scan Modeling and Performance Analysis for Extensive Terminal Information Identification
Vol. 42, No. 4, pp. 785-790, Apr. 2017
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Cite this article
[IEEE Style]
S. Im, S. Shin, B. Roh, J. Lee, "Scan Modeling and Performance Analysis for Extensive Terminal Information Identification," The Journal of Korean Institute of Communications and Information Sciences, vol. 42, no. 4, pp. 785-790, 2017. DOI: .
[ACM Style]
Sun-young Im, Seung-hun Shin, Byeong-hee Roh, and Jung-tae Lee. 2017. Scan Modeling and Performance Analysis for Extensive Terminal Information Identification. The Journal of Korean Institute of Communications and Information Sciences, 42, 4, (2017), 785-790. DOI: .
[KICS Style]
Sun-young Im, Seung-hun Shin, Byeong-hee Roh, Jung-tae Lee, "Scan Modeling and Performance Analysis for Extensive Terminal Information Identification," The Journal of Korean Institute of Communications and Information Sciences, vol. 42, no. 4, pp. 785-790, 4. 2017.