Design of DC Voltage Sets to Reduce the Probability of Losses of Ions Pasing through the Intersection of Planar Ion Traps
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Yun-Jae Park Min-Jae Lee Seok-Jun Hong Chang-Hyun Jung Jun-Ho Cheong Tae-Hyun Kim Yeong-Dae Kwon Dong-Il Cho
Vol. 43, No. 10, pp. 1597-1604, Oct. 2018
10.7840/kics.2018.43.10.1597
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Cite this article
[IEEE Style]
Y. Park, M. Lee, S. Hong, C. Jung, J. Cheong, T. Kim, Y. Kwon, D. Cho, "Design of DC Voltage Sets to Reduce the Probability of Losses of Ions Pasing through the Intersection of Planar Ion Traps," The Journal of Korean Institute of Communications and Information Sciences, vol. 43, no. 10, pp. 1597-1604, 2018. DOI: 10.7840/kics.2018.43.10.1597.
[ACM Style]
Yun-Jae Park, Min-Jae Lee, Seok-Jun Hong, Chang-Hyun Jung, Jun-Ho Cheong, Tae-Hyun Kim, Yeong-Dae Kwon, and Dong-Il Cho. 2018. Design of DC Voltage Sets to Reduce the Probability of Losses of Ions Pasing through the Intersection of Planar Ion Traps. The Journal of Korean Institute of Communications and Information Sciences, 43, 10, (2018), 1597-1604. DOI: 10.7840/kics.2018.43.10.1597.
[KICS Style]
Yun-Jae Park, Min-Jae Lee, Seok-Jun Hong, Chang-Hyun Jung, Jun-Ho Cheong, Tae-Hyun Kim, Yeong-Dae Kwon, Dong-Il Cho, "Design of DC Voltage Sets to Reduce the Probability of Losses of Ions Pasing through the Intersection of Planar Ion Traps," The Journal of Korean Institute of Communications and Information Sciences, vol. 43, no. 10, pp. 1597-1604, 10. 2018. (https://doi.org/10.7840/kics.2018.43.10.1597)