Research on Reliability Evaluation of Embedded Display Devices by Analyzing Demanded Response Characteristics According to the RAS Perspective 


Vol. 44,  No. 4, pp. 709-718, Apr.  2019
10.7840/kics.2019.44.4.709


PDF
  Abstract

As many embedded display devices are developing with the development of technology, developers recognized the need to make a judgement whether normal operation status of these devices or not. Therefore, we suggest the evaluation method and implement the evaluation system to verify demanded response characteristics of embedded display devices based on the proposed method. Researched results are expected that the display interface of various embedded display devices can be easily test using automated software.

  Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.


  Cite this article

[IEEE Style]

K. Lee and K. Yim, "Research on Reliability Evaluation of Embedded Display Devices by Analyzing Demanded Response Characteristics According to the RAS Perspective," The Journal of Korean Institute of Communications and Information Sciences, vol. 44, no. 4, pp. 709-718, 2019. DOI: 10.7840/kics.2019.44.4.709.

[ACM Style]

Kyungroul Lee and Kangbin Yim. 2019. Research on Reliability Evaluation of Embedded Display Devices by Analyzing Demanded Response Characteristics According to the RAS Perspective. The Journal of Korean Institute of Communications and Information Sciences, 44, 4, (2019), 709-718. DOI: 10.7840/kics.2019.44.4.709.

[KICS Style]

Kyungroul Lee and Kangbin Yim, "Research on Reliability Evaluation of Embedded Display Devices by Analyzing Demanded Response Characteristics According to the RAS Perspective," The Journal of Korean Institute of Communications and Information Sciences, vol. 44, no. 4, pp. 709-718, 4. 2019. (https://doi.org/10.7840/kics.2019.44.4.709)

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)






pISSN : 1226 - 4717
eISSN : 2287 - 3880