Secrecy Rate Analysis of Physical-Layer Security Technique for Cluster-Based D2D Communications 


Vol. 48,  No. 10, pp. 1215-1218, Oct.  2023
10.7840/kics.2023.48.10.1215


PDF
  Abstract

In this paper, we investigate and analyze the secrecy rate of an artificial noise-based physical-layer security technique for cluster-based D2D communications. D2D clusters consist of multiple devices including a cluster head in charge of broadcasting the data to other cluster members. We consider two D2D clusters and a single eavesdropper, where one D2D cluster generates artificial noise to enhance the secrecy of another D2D cluster. We derive an approximation of the secrecy rate and verify our analysis through simulations.

  Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.


  Related Articles
  Cite this article

[IEEE Style]

I. Bang, J. Kim, T. Kim, "Secrecy Rate Analysis of Physical-Layer Security Technique for Cluster-Based D2D Communications," The Journal of Korean Institute of Communications and Information Sciences, vol. 48, no. 10, pp. 1215-1218, 2023. DOI: 10.7840/kics.2023.48.10.1215.

[ACM Style]

Inkyu Bang, Jong-Hyun Kim, and Taehoon Kim. 2023. Secrecy Rate Analysis of Physical-Layer Security Technique for Cluster-Based D2D Communications. The Journal of Korean Institute of Communications and Information Sciences, 48, 10, (2023), 1215-1218. DOI: 10.7840/kics.2023.48.10.1215.

[KICS Style]

Inkyu Bang, Jong-Hyun Kim, Taehoon Kim, "Secrecy Rate Analysis of Physical-Layer Security Technique for Cluster-Based D2D Communications," The Journal of Korean Institute of Communications and Information Sciences, vol. 48, no. 10, pp. 1215-1218, 10. 2023. (https://doi.org/10.7840/kics.2023.48.10.1215)
Vol. 48, No. 10 Index

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)






pISSN : 1226 - 4717
eISSN : 2287 - 3880