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A Study on a Deep Learning Model for Predicting MicroRNA-Gene Association Using Distance-Based Labeling Methods
Jaein Kim Seung-Won Yoon In-Woo Hwang Kyu-Chul Lee
Vol. 47, No. 10, pp. 1637-1644, Oct. 2022
10.7840/kics.2022.47.10.1637
Vol. 47, No. 10, pp. 1637-1644, Oct. 2022
10.7840/kics.2022.47.10.1637