The Evaluation of Signal Reliability for Single Stuck-at-type Fault in Digital Circuit
Vol. 12, No. 2, pp. 139-147, Apr. 1987
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Cite this article
[IEEE Style]
김영일 and 오영환, "The Evaluation of Signal Reliability for Single Stuck-at-type Fault in Digital Circuit," The Journal of Korean Institute of Communications and Information Sciences, vol. 12, no. 2, pp. 139-147, 1987. DOI: .
[ACM Style]
김영일 and 오영환. 1987. The Evaluation of Signal Reliability for Single Stuck-at-type Fault in Digital Circuit. The Journal of Korean Institute of Communications and Information Sciences, 12, 2, (1987), 139-147. DOI: .
[KICS Style]
김영일 and 오영환, "The Evaluation of Signal Reliability for Single Stuck-at-type Fault in Digital Circuit," The Journal of Korean Institute of Communications and Information Sciences, vol. 12, no. 2, pp. 139-147, 2. 1987.